X-ray Diffraction and Atomic Force Microscopy of RuO2 thin films
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2021-01-01
2021-06-30
2021-06-30
Date completed
2022-08-15
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Title
X-ray Diffraction and Atomic Force Microscopy of RuO2 thin films
Published Date
2022-08-18
Author Contact
Jalan, Bharat
bjalan@umn.edu
bjalan@umn.edu
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Experimental Data
Experimental Data
Abstract
X-ray Diffraction data of the RuO2 samples were obtained to assess the crystallinity and epitaxial nature of the thin films grown on different substrates.
Atomic Force Microscopy was used to determine the surface morphology changes as a function of thickness and epitaxial strain and correlate it with the observed oxygen evolution activity.
Description
X-ray Diffraction 2theta-omega couples scans for RuO2 on r-Al2O3 (Supplementary Figure 1 a) of different thicknesses. Similar data is used for comparing RuO2 films with comparable thickness grown on r-Al2O3 and TiO2 (101) substrate (Supplemetary Fig 6b).
Atomic Force Microscopy images acquired using a Bruker multimode for comparing surface morphology change as a function of thickness of RuO2 film grown on r-Al2O3 substrate (Supplementary Fig 1 b)
Referenced by
https://doi.org/10.1016/j.mtener.2022.101087
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University of Minnesota MRSEC under Award Number DMR-2011401
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Suggested citation
Nunn, William; Manjeshwar, Anusha K; Nair, Sreejith; Jalan, Bharat. (2022). X-ray Diffraction and Atomic Force Microscopy of RuO2 thin films. Retrieved from the Data Repository for the University of Minnesota (DRUM), https://doi.org/10.13020/qda2-zf10.
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| File View/Open | Description | Size |
|---|---|---|
| RuO2 37_coupled scan_SupFig1.txt | X-ray Diffraction coupled scan for 8 nm RuO2 on r-Al2O3 | 174.34 KB |
| RuO2 39_coupled scan_SupFig1.txt | X-ray Diffraction coupled scan for 34 nm RuO2 on r-Al2O3 | 171.93 KB |
| RuO2 40_coupled scan_SupFig1.txt | X-ray Diffraction coupled scan for 48 nm RuO2 on r-Al2O3 | 170.43 KB |
| RuO2 41_coupled scan_SubFig1_6.txt | X-ray Diffraction coupled scan for 11 nm RuO2 on r-Al2O3 | 171.2 KB |
| RuO2 70_coupled scan_SupFig6.txt | X-ray Diffraction coupled scan for 10 nm RuO2 on TiO2(101) | 54.2 KB |
| RuO2 37 AFM_SupFig1.spm | Atomic Force Microscopy for 8 nm RuO2 on r-Al2O3 | 6.08 MB |
| RuO2 40 AFM._SupFig1.spm | Atomic Force Microscopy for 48 nm RuO2 on r-Al2O3 | 6.08 MB |
| README.txt | Description of data | 4.84 KB |
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