This readme.txt file was generated on 2022-08-18 by Sreejith Nair Recommended citation for the data: Nunn, William; Manjeshwar, Anusha K; Nair, Sreejith; Jalan, Bharat. (2022). X-ray Diffraction and Atomic Force Microscopy of RuO2 thin films. Retrieved from the Data Repository for the University of Minnesota, https://doi.org/10.13020/qda2-zf10. ------------------- GENERAL INFORMATION ------------------- 1. Title of Dataset: X-ray Diffraction and Atomic Force Microscopy of RuO2 thin films 2. Author Information Name: William Nunn Institution:University of Minnesota, Twin Cities Email:nunnx029@umn.edu ORCID: Name: Anusha K Manjeshwar Institution:University of Minnesota, Twin Cities Email:kamat086@umn.edu ORCID:0000-0001-6396-5860 Name: Sreejith Nair Institution:University of Minnesota, Twin Cities Email:nair0074@umn.edu ORCID:0000-0002-4457-2698 Name: Bharat Jalan Institution:University of Minnesota, Twin Cities Email: bjalan@umn.edu ORCID:0000-0002-7940-0490 3. Date published or finalized for release: 2022-08-18 4. Date of data collection (single date, range, approximate date): 2021-01-01 to 2021-06-30 5. Geographic location of data collection (where was data collected?): University of Minnesota, Twin Cities 6. Information about funding sources that supported the collection of the data: University of Minnesota MRSEC under Award Number DMR-2011401 7. Overview of the data (abstract): X-ray Diffraction data of the RuO2 samples were obtained to assess the crystallinity and epitaxial nature of the thin films grown on different substrates. Atomic Force Microscopy was used to determine the surface morphology changes as a function of thickness and epitaxial strain and correlate it with the observed oxygen evolution activity. -------------------------- SHARING/ACCESS INFORMATION -------------------------- 1. Licenses/restrictions placed on the data: Attribution-NonCommercial-NoDerivs 3.0 United States (http://creativecommons.org/licenses/by-nc-nd/3.0/us/) 2. Links to publications that cite or use the data: https://doi.org/10.1016/j.mtener.2022.101087 3. Was data derived from another source? If yes, list source(s): 4. Terms of Use: Data Repository for the U of Minnesota (DRUM) By using these files, users agree to the Terms of Use. https://conservancy.umn.edu/pages/drum/policies/#terms-of-use --------------------- DATA & FILE OVERVIEW --------------------- File List Filename: RuO2 37_coupled scan_SupFig1.txt Short description: X-ray Diffraction coupled scan for 8 nm RuO2 on r-Al2O3 Filename: RuO2 39_coupled scan_SupFig1.txt Short description: X-ray Diffraction coupled scan for 34 nm RuO2 on r-Al2O3 Filename: RuO2 40_coupled scan_SupFig1.txt Short description: X-ray Diffraction coupled scan for 48 nm RuO2 on r-Al2O3 Filename: RuO2 41_coupled scan_SupFig1&6.txt Short description: X-ray Diffraction coupled scan for 11 nm RuO2 on r-Al2O3 Filename: RuO2 70_coupled scan_SupFig6.txt Short description: X-ray Diffraction coupled scan for 10 nm RuO2 on TiO2(101) Filename: RuO2 37 AFM_SupFig1.spm Short description: Atomic Force Microscopy for 8 nm RuO2 on r-Al2O3 Filename: RuO2 40 AFM_SupFig1.spm Short description: Atomic Force Microscopy for 48 nm RuO2 on r-Al2O3 2. Relationship between files: -------------------------- METHODOLOGICAL INFORMATION -------------------------- 1. Description of methods used for collection/generation of data: Surface roughness was measured using a Bruker Multimode Atomic Force Microscope in contact and peak force modes. X-ray diffraction data was acquired using a Rigaku Smartlab XE with Cu Kalpha radiation 2. Methods for processing the data: These are raw data files as obtained from the measurement without any processing. 3. Instrument- or software-specific information needed to interpret the data: The atomic force microscope images can be processed using an open source software like Gwyddion. 4. Standards and calibration information, if appropriate: 5. Environmental/experimental conditions: 6. Describe any quality-assurance procedures performed on the data: 7. People involved with sample collection, processing, analysis and/or submission: ----------------------------------------- DATA-SPECIFIC INFORMATION FOR: X-ray diffraction coupled scans ----------------------------------------- 1. Number of variables: 1 2. Number of cases/rows: Only 1 continuous measurement for each sample for a range of sample to detector angles 3. Variable List A. Name: 2theta (degrees) Description: Twice the angle between the vectors defined by the incident x-ray beam and surface of the sample 4. Measured quantity: Diffracted x-ray beam intensity when detector position at angle theta with respect to sample surface