Data supporting Holey Substrate-Directed Strain Pattering in Bilayer MoS2

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Collection period

2019-05-23
2021-06-21

Date completed

09-04-2021

Date updated

Time period coverage

Geographic coverage

Source information

Journal Title

Journal ISSN

Volume Title

Title

Data supporting Holey Substrate-Directed Strain Pattering in Bilayer MoS2

Published Date

2021-11-10

Group

Author Contact

Flannigan, David J
flan0076@umn.edu

Type

Dataset
3D Imaging Data
Experimental Data
Simulation Data

Abstract

This data set contains transmission electron microscopy (TEM), atomic force microscopy (AFM), and atomistic simulation data supporting "Holey Substrate-Directed Strain Pattering in Bilayer MoS2" manuscript cited in referenced by.

Description

All TEM images are in .dm3 or .tif file formats, which can be accessed by Gatan DigitalMicrograph software. The AFM data showing topographic mapping were provided in .gwy and .txt file formats. Detailed description of the simulation data is provided in a readme file.

Referenced by

https://doi.org/10.1021/acsnano.1c08348

Related to

Replaces

Publisher

Funding information

National Science Foundation through the University of Minnesota MRSEC under Award Number DMR-2011401
National Science Foundation under Grant No. DMR-1654318
the Army Research Office (W911NF-14-1-0247) under the MURI program
NSF through the UMN MRSEC program under Award Number DMR-2011401
Louise T. Dosdall Fellowship

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Previously Published Citation

Suggested citation

Zhang, Yichao; Choi, Moon-Ki; Haugstad, Greg; Tadmor, Ellad B; Flannigan, David J. (2021). Data supporting Holey Substrate-Directed Strain Pattering in Bilayer MoS2. Retrieved from the Data Repository for the University of Minnesota (DRUM), https://doi.org/10.13020/14jz-pj24.
View/Download file
File View/OpenDescriptionSize
Rawdata.zipTEM, AFM, and simulation data960 MB
ReadMe.txtReadMe7.69 KB

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