This codebook.txt file was generated on by ------------------- GENERAL INFORMATION ------------------- 1. Title of Dataset: Data supporting Holey Substrate-Directed Strain Pattering in Bilayer MoS2 2. Author Information Principal Investigator Contact Information Name: David J. Flannigan Institution: University of Minnesota Address: Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455, United States Email: flan0076@umn.edu ORCID: 0000-0002-1829-1868 Associate or Co-investigator Contact Information Name: Yichao Zhang Institution: University of Minnesota Address: Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455, United States Email: ychzhang@illinois.edu ORCID: 0000-0003-1225-3278 Associate or Co-investigator Contact Information Name: Moon-Ki Choi Institution: University of Minnesota Address: Department of Aerospace Engineering and Mechanics, University of Minnesota, Minneapolis, Minnesota 55455, United States Email: choi0652@umn.edu ORCID:N/A Associate or Co-investigator Contact Information Name: Greg Haugstad Institution: University of Minnesota Address: Characterization Facility, University of Minnesota, Minneapolis, Minnesota 55455, United States Email: haugs001@umn.edu ORCID:N/A Associate or Co-investigator Contact Information Name: Ellad B. Tadmor Institution: University of Minnesota Address: Department of Aerospace Engineering and Mechanics, University of Minnesota, Minneapolis, Minnesota 55455, United States Email: tadmor@umn.edu ORCID: 0000-0003-3311-6299 3. Date of data collection 2019-05-23 to 2021-06-21 4. Geographic location of data collection (where was data collected?): University of Minnesota, Minneapolis, Minnesota 55455, United States 5. Information about funding sources that supported the collection of the data: Sponsorship: National Science Foundation through the University of Minnesota MRSEC under Award Number DMR-2011401; National Science Foundation under Grant No. DMR-1654318; the Army Research Office (W911NF-14-1-0247) under the MURI program; NSF through the UMN MRSEC program under Award Number DMR-2011401; Louise T. Dosdall Fellowship -------------------------- SHARING/ACCESS INFORMATION -------------------------- Suggested Data Citation: Zhang, Yichao; Choi, Moon-Ki; Haugstad, Greg; Tadmor, Ellad B; Flannigan, David J. (2021). Data supporting Holey Substrate-Directed Strain Pattering in Bilayer MoS2. Retrieved from the Data Repository for the University of Minnesota, https://hdl.handle.net/11299/225240 1. Licenses/restrictions placed on the data: CC0 1.0 Universal 2. Links to publications that cite or use the data: https://pubs.acs.org/doi/10.1021/acsnano.1c08348 3. Links to other publicly accessible locations of the data: N/A 4. Links/relationships to ancillary data sets: 5. Was data derived from another source? If yes, list source(s): --------------------- DATA & FILE OVERVIEW --------------------- 1. File List A. Filename: AFM data Short description: raw data of the atomic-force-microscopy (AFM) topographic map B. Filename: Simulation data Short description: atomistic-simulation data C. Filename: TEM data Short description: transmission-electron-microscope (TEM) images 2. Relationship between files: Three different methods to characterize/analyze the observed phenomenon 3. Additional related data collected that was not included in the current data package: N/A 4. Are there multiple versions of the dataset? no If yes, list versions: Name of file that was updated: i. Why was the file updated? ii. When was the file updated? Name of file that was updated: i. Why was the file updated? ii. When was the file updated? -------------------------- METHODOLOGICAL INFORMATION -------------------------- 1. Description of methods used for collection/generation of data: transmission electron microscopy, atomic force microscopy, and atomistic simulations 2. Methods for processing the data: The TEM images were analyzed using MATLAB. The images were imported into MATLAB and converted into 2D arrays. The AFM data were processed using Gwyddion. The detailed method of processing the simulation data is described in the associated publication. 3. Instrument- or software-specific information needed to interpret the data: N/A 4. Standards and calibration information, if appropriate: This information is included in the supplementary information of the publication. 5. Environmental/experimental conditions: N/A 6. Describe any quality-assurance procedures performed on the data: The brightness and contrast of each TEM image was enhanced uniformally across the entire image. 7. People involved with sample collection, processing, analysis and/or submission: All of the authors listed on the publication ----------------------------------------- DATA-SPECIFIC INFORMATION FOR: ----------------------------------------- 1. Number of variables: 2. Number of cases/rows: 3. Missing data codes: Code/symbol Definition Code/symbol Definition 4. Variable List A. Name: Description: Value labels if appropriate B. Name: Gender Description: Gender of respondent 1 = Male 2 = Female 3 = Other C. Name: Description: Value labels if appropriate -------------------------- Data tree -------------------------- +---AFM data | Figure 3_AFM data.gwy | Figure 3_AFM data.txt | +---Simulation data | .DS_Store | bend1_fig5c.csv | bend1_fig5d.csv | bend1_fig5e.csv | bend2_fig5c.csv | bend2_fig5d.csv | bend2_fig5e.csv | bend3_fig5c.csv | bend3_fig5d.csv | bend3_fig5e.csv | bend4_fig5c.csv | bend4_fig5d.csv | bend4_fig5e.csv | bend5_fig5c.csv | bend5_fig5d.csv | bend5_fig5e.csv | bend6_fig5c.csv | bend6_fig5d.csv | bend6_fig5e.csv | figure5b.csv | README | test_function.m | x_fig5c.csv | x_fig5d.csv | x_fig5e.csv | y_fig5c.csv | y_fig5d.csv | y_fig5e.csv | z_fig5c.csv | z_fig5d.csv | z_fig5e.csv | \---TEM data | Figure 1 and 2_High-mag TEM image.dm3 | Figure 1_Low-mag TEM image.dm3 | Figure 2_Diffraction pattern.dm3 | Figure 3_Bright-field image.tif | FIgure 3_Difraction pattern.dm3 | \---Figure 2_TEM dark-field images Dark Field_1.dm3 Dark Field_10.dm3 Dark Field_11.dm3 Dark Field_12.dm3 Dark Field_2.dm3 Dark Field_3.dm3 Dark Field_4.dm3 Dark Field_5.dm3 Dark Field_6.dm3 Dark Field_7.dm3 Dark Field_8.dm3 Dark Field_9.dm3