Data for Surface Relief Terraces in Double Gyroid-Forming Polystyrene-block-Polylactide Thin Films

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Data for Surface Relief Terraces in Double Gyroid-Forming Polystyrene-block-Polylactide Thin Films

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Ellison, Christopher J


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This study describes the thin film self-assembly behavior of a polystyrene-block-polylactide (SL-G) diblock copolymer, which undergoes melt self-assembly in bulk into a double gyroid (DG) network phase with a cubic unit cell parameter a = 52.7 nm. Scanning electron microscopy (SEM) and grazing-incidence small-angle X-ray scattering (GISAXS) reveal that thermally annealing 140–198 nm thick copolymer films on SiO2 substrates below the morphological order-to-disorder transition temperature yields polydomain DG structures, in which the (422) planes are oriented parallel to the surface. Bright-field optical microscopy (OM) and atomic force microscopy (AFM) analyses further reveal the film thickness-dependent formation of topographical terraces, including islands, holes, and bicontinuous features. The occurrence of these features sensitively depends on the incommensurability of the as-prepared film thickness and the (211)-interplanar spacing (d211) of the DG unit cell. While the steps heights between adjacent terraces exhibiting characteristic “double wave” patterns of the DG (422) planes coincide with d211, previously unreported transition zones between adjacent terraces are observed wherein “boomerang” and “droplet” patterns are observed. These intermediate patterns follow the expected sequence of adjacent termination planes of the bulk DG unit cell along the [211] direction, as confirmed by comparisons with self-consistent mean-field theory calculations.


The data folder contains all data of the figures in the article and SI appendix, including nuclear magnetic resonance (NMR), size exclusion chromatography (SEC), differential scanning calorimetry (DSC), thermogravimetric analysis (TGA), ellipsometer, Transmission small-angle X-ray scattering (T-SAXS), Bright-field optical microscopy (OM), scanning electron microscopy (SEM), atomic force microscopy (AFM), grazing-incidence small-angle X-ray scattering (GISAXS), self-consistent field theory (SCFT) simulation data. See the readme.txt file for further details.

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National Science Foundation (NSF) through the Materials Research Science and Engineering Center (MRSEC) under Award Number DMR-2011401
Characterization Facility, University of Minnesota, which receives partial support from the NSF through the MRSEC (Award Number DMR-2011401) and the NNCI (Award Number ECCS-2025124) programs
Synchrotron X-ray resources at the Sector 12-ID-B and 8-ID-E beamlines of the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science user facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357

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Yang, Szu-Ming; Oh, Jinwoo; Magruder, Benjamin R; Kim, HeeJoong; Dorfman, Kevin D; Mahanthappa, Mahesh K; Ellison, Christopher J. (2023). Data for Surface Relief Terraces in Double Gyroid-Forming Polystyrene-block-Polylactide Thin Films. Retrieved from the Data Repository for the University of Minnesota (DRUM),
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