Electronic Conduction in Freestanding Silicon Nanocrystal Films

Zheng, Jingyang
2017
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Electronic Conduction in Freestanding Silicon Nanocrystal Films

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2017

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The dark conductivity of a 5.5 nanometer diameter freestanding silicon nanocrystal film was measured over a temperature range of 305K to 500K for increasing oxidation time. Comparisons are made to previous measurements of 12 nm films of similar composition. A stretched exponential time dependence for the decrease of the conductivity with air exposure time is observed for conductivity at 340K, while previous data indicated exponential decay or power law decay. Changes in conduction mechanism are also observed using the Zabrodskii analysis, indicating that conduction is either not thermally activated or that initial conductivity is temperature dependent.

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Zheng, Jingyang. (2017). Electronic Conduction in Freestanding Silicon Nanocrystal Films. Retrieved from the University Digital Conservancy, https://hdl.handle.net/11299/189113.

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