Browsing by Author "Nair, Sreejith"
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Item Supporting data for "Semi-metallic SrIrO3 films using solid-source metal-organic molecular beam epitaxy"(2022-12-20) Choudhary, Rashmi; Nair, Sreejith; Yang, Zhifei; Lee, Dooyong; Jalan, Bharat; choud140@umn.edu; Choudhary, Rashmi; Jalan MBE LabThe data contains X-ray and electrical characterization of SrIrO3 films grown by solid-source metal-organic molecular beam epitaxy (SSMOMBE). It reveals that SSMOMBE can produce high-quality crystals and has numerous other advantages compared to conventional molecular beam epitaxy.Item Supporting data for Mending Cracks Atom-by-atom in Rutile TiO2 with Electron Beam Radiolysis(2023-08-28) Guo, Silu; Yun, Hwanhui; Nair, Sreejith; Jalan, Bharat; Mkhoyan, K. Andre; mkhoyan@umn.edu; Mkhoyan, K. Andre; Materials Research Science & Engineering CenterExperimental data for a manuscript "Mending Cracks Atom-by-atom in Rutile TiO2 with Electron Beam Radiolysis". Essential data includes scanning transmission electron microscopy (STEM) raw images and electron energy-loss spectroscopy (EELS) spectrum data. Important atomic line scans data and radiolysis cross section data file are included to support our “two-step rolling” model of mobile octahedral building blocks enabling radiolysis-driven atomic migration.Item X-ray Diffraction and Atomic Force Microscopy of RuO2 thin films(2022-08-18) Nunn, William; Manjeshwar, Anusha K; Nair, Sreejith; Jalan, Bharat; bjalan@umn.edu; Jalan, Bharat; University of Minnesota Jalan MBE LabX-ray Diffraction data of the RuO2 samples were obtained to assess the crystallinity and epitaxial nature of the thin films grown on different substrates. Atomic Force Microscopy was used to determine the surface morphology changes as a function of thickness and epitaxial strain and correlate it with the observed oxygen evolution activity.