Browsing by Author "Flannigan, David J"
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Item Data supporting Coherent Phonon Disruption and Lock-In during a Photoinduced Charge-Density-Wave Phase Transition(2021-07-22) Reisbick, Spencer A; Zhang, Yichao; Chen, Jialiang; Engen, Paige E; Flannigan, David J; sreisbick@bnl.gov; Reisbick, Spencer A; University of Minnesota Ultrafast Electron Microscopy LabThis dataset includes 4D ultrafast electron microscopy (UEM) data and ultrafast selected-area electron diffraction (U-SAED) data supporting the paper "Coherent Phonon Disruption and Lock-In during a Photoinduced Charge-Density-Wave Phase Transition" J. Phys. Chem. Lett., 2021, 12 (27). https://doi.org/10.1021/acs.jpclett.1c01673Item Data supporting Holey Substrate-Directed Strain Pattering in Bilayer MoS2(2021-11-10) Zhang, Yichao; Choi, Moon-Ki; Haugstad, Greg; Tadmor, Ellad B; Flannigan, David J; flan0076@umn.edu; Flannigan, David JThis data set contains transmission electron microscopy (TEM), atomic force microscopy (AFM), and atomistic simulation data supporting "Holey Substrate-Directed Strain Pattering in Bilayer MoS2" manuscript cited in referenced by.Item High-Resolution Analog of Time-Domain Phonon Spectroscopy in the TEM Experimental Data and Analysis 2019-2020(2020-03-16) VandenBussche, Elisah J; Flannigan, David J; flan0076@umn.edu; Flannigan, David J; Flannigan Lab, CEMS Department, University of MinnesotaThe behavior of coherent acoustic phonons (CAPs) as they propagate through a material is a function of the material’s optoelectronic and structural properties, making these collective oscillations a multi-faceted characterization tool. While CAPs are usually detected using transient reflectivity measurements, they have also previously been observed directly in real space using ultrafast electron microscopy (UEM). Here, we report use of UEM to measure localized CAP behavior in an amorphized and annealed GaAs specimen, and demonstrate the sensitivity of this measurement to atomic structure changes. The velocities are compared to expected values for speed of sound in order to draw conclusions about the degree of crystallinity of the specimen pre- and post-annealing. The ability to use a real-space technique to observe CAP behavior with high spatial resolution opens the door to measurements of spatially heterogeneous structural and optoelectronic properties. The data acquired in this experiment as well as analysis code are released here to enable open access to published data.Item Simulation data supporting Toward A-fs-meV Resolution in Electron Microscopy: Systematic Simulation of the Temporal Spread of Single-Electron Packets(2021-10-12) Curtis, Wyatt, A; Flannigan, David J; flan0076@umn.edu; Flannigan, David J; University of Minnesota Ultrafast Electron Microscopy LabThis data contains the simulation output from General Particle Tracer to generate the figures in the related publication. See the related publication for detailed information on each dataset.Item Supporting Data for Mitigating Damage to Hybrid Perovskites Using Pulsed-Beam TEM(2021-01-08) VandenBussche, Elisah J; Flannigan, David J; Holmes, Russell J; Clark, Catherine P; vand0837@umn.edu; VandenBussche, Elisah; Flannigan Lab, CEMS Department, University of MinnesotaUsing a pulsed-beam transmission electron microscope, we discover a reduction in damage to methylammonium lead iodide (MAPbI3) as compared to conventional beams delivered at the same dose rates. This work provides insights into damage processes and durability in hybrid perovskites and also illustrates the viability of using pulsed-beam TEM to explore the associated molecular-level routes to degradation, analogous to laser-accelerated energetic pulsed electron beams and the study of damage to biomolecules, cells, and tissues in radiobiology. The data acquired in this experiment are released here to enable open access to published data in accordance with MRSEC data policies.