Error estimates for a finite element method for the drift-diffusion semiconductor device equations
No Thumbnail Available
View/Download File
Persistent link to this item
Statistics
View StatisticsJournal Title
Journal ISSN
Volume Title
Title
Error estimates for a finite element method for the drift-diffusion semiconductor device equations
Authors
Published Date
1992-08
Publisher
Type
Abstract
Keywords
Description
Replaces
License
Collections
Series/Report Number
Funding information
Isbn identifier
Doi identifier
Previously Published Citation
Other identifiers
Suggested citation
Chen, Zhangxin; Cockburn, Bernardo. (1992). Error estimates for a finite element method for the drift-diffusion semiconductor device equations. Retrieved from the University Digital Conservancy, https://hdl.handle.net/11299/2148.
Content distributed via the University Digital Conservancy may be subject to additional license and use restrictions applied by the depositor. By using these files, users agree to the Terms of Use. Materials in the UDC may contain content that is disturbing and/or harmful. For more information, please see our statement on harmful content in digital repositories.