Measurement of the effects of the localized field of a magnetic force microscope tip on a 180° domain wall.
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Measurement of the effects of the localized field of a magnetic force microscope tip on a 180° domain wall.
Published Date
1997
Publisher
Journal of Applied Physics (American Institute of Physics)
Type
Article
Abstract
Opposite polarity magnetic force microscope(MFM) profiles of domain walls (DWs) in magnetite were measured with a commercial MFM tip magnetized in opposite directions perpendicular to the sample surface. The influence of the tip field on a DW resulted in an overall more attractive interaction. The difference between opposite polarity DW profiles provided a qualitative measurement of the reversible changes in DW structure due to the localized field of the MFM tip. The dependence of the measured alteration on tip-sample separation was fit with a power law at different positions across the DW. The rate of decay of the alteration with tip-sample separation, quantified by the exponent of the power law fit, varied across the DW and was much slower than expected from a simple model.
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This work was supported by the Office of Naval Research, N00014-94-1-0123 (SF, EDD, RP). In addition, BMM was supported by the National Science Foundation, grants EAR-9304520 and EAR-9526812. This is contribution 9608 of the Institute for Rock Magnetism
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10.1063/1.364500
Previously Published Citation
Foss, S., E. D. Dahlberg, R. Proksch and B. M. Moskowitz (1997). "Measurement of the effects of the localized field of a magnetic force microscope tip on a 180° domain wall." Journal of Applied Physics 81(8): 5032-5034.
Suggested citation
Foss, Sheryl; Dahlberg, E.D.; Proksch, Roger; Moskowitz, Bruce. (1997). Measurement of the effects of the localized field of a magnetic force microscope tip on a 180° domain wall.. Retrieved from the University Digital Conservancy, 10.1063/1.364500.
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