Foss, SherylProksch, RogerDahlberg, E.D.Moskowitz, BruceWalsh, B.2015-11-052015-11-051996Foss, S., R. Proksch, E. D. Dahlberg, B. M. Moskowitz and B. Walsh (1996). "Localized micromagnetic perturbation of domain walls in magnetite using a magnetic force microscope." Applied Physics Letters 69(22): 3426-3428.https://hdl.handle.net/11299/175173Magnetic force microscope(MFM) profiles of domain walls (DWs) in magnetite were measured using commercially available MFM tips. Opposite polarity profiles of a single DW segment were obtained by magnetizing the MFM tip in opposite directions perpendicular to the sample surface. During a measurement, the field of the tip locally magnetized the DW, resulting in a more attractive tip‐sample interaction. The difference between opposite polarity DW profiles provided a qualitative measurement of the reversible changes in DW structure due to the localized field of the MFM tip.enrock magnetism, mineral magnetism, magnetic domain imagingArticle10.1063/1.117281