A Bayesian Scheme to Detect Changes in the Mean of a Short Run Process

Tsiamyrtzis, PangiotisHawkins, Douglas M.2018-08-152018-08-152002-09https://hdl.handle.net/11299/1996641 online resource (PDF, 24 pages)en-USA Bayesian Scheme to Detect Changes in the Mean of a Short Run ProcessTechnical Report