Foss, SherylDahlberg, E.D.Proksch, RogerMoskowitz, Bruce2015-11-052015-11-051997Foss, S., E. D. Dahlberg, R. Proksch and B. M. Moskowitz (1997). "Measurement of the effects of the localized field of a magnetic force microscope tip on a 180° domain wall." Journal of Applied Physics 81(8): 5032-5034.https://hdl.handle.net/11299/175174Opposite polarity magnetic force microscope(MFM) profiles of domain walls (DWs) in magnetite were measured with a commercial MFM tip magnetized in opposite directions perpendicular to the sample surface. The influence of the tip field on a DW resulted in an overall more attractive interaction. The difference between opposite polarity DW profiles provided a qualitative measurement of the reversible changes in DW structure due to the localized field of the MFM tip. The dependence of the measured alteration on tip-sample separation was fit with a power law at different positions across the DW. The rate of decay of the alteration with tip-sample separation, quantified by the exponent of the power law fit, varied across the DW and was much slower than expected from a simple model.enrock magnetism, mineral magnetism, magnetic domain imagingArticle10.1063/1.364500