Zhang, YichaoChoi, Moon-KiHaugstad, GregTadmor, Ellad BFlannigan, David J2021-11-102021-11-102021-11-10https://hdl.handle.net/11299/225240All TEM images are in .dm3 or .tif file formats, which can be accessed by Gatan DigitalMicrograph software. The AFM data showing topographic mapping were provided in .gwy and .txt file formats. Detailed description of the simulation data is provided in a readme file.This data set contains transmission electron microscopy (TEM), atomic force microscopy (AFM), and atomistic simulation data supporting "Holey Substrate-Directed Strain Pattering in Bilayer MoS2" manuscript cited in referenced by.CC0 1.0 Universalhttp://creativecommons.org/publicdomain/zero/1.0/2D materialsTMDTEMAFMAtomic simulationsDatasethttps://doi.org/10.13020/14jz-pj24