Goh, David S.2011-02-012011-02-011979Goh, David S. (1979). Empirical versus random item selection in the design of intelligence test short forms-The WISC-R example. Applied Psychological Measurement, 3, 75-82. doi:10.1177/014662167900300109doi:10.1177/014662167900300109https://hdl.handle.net/11299/99554This study demonstrated that the design of current intelligence test short forms could be improved by employing a more effective method of item selection based on psychometric theory. Two short forms of the recently published WISC-R were developed, one employing a design determined by empirical item analysis results of the standard test battery and the other employing the well-known Yudin scheme determined by systematic random selection of test items. In all analyses the item analysis method of item selection was shown to yield more accurate results than the Yudin procedure. Practical usefulness as well as limitations of the present WISC-R Short form are discussed.enArticle