This readme.txt file was generated on 20250725 by Maya Ramamurthy Recommended citation for the data: Ramamurthy, Maya; Pakhomenko, Evgeny; Keil, John; He, Siliang; Kapur, Abhinav; Hershey, Kyle W; Zheng, Ying; Holmes, Russell J; Ferry, Vivian E. (2025). Data for Multi-objective OLED Optimization Manuscript. Retrieved from the Data Repository for the University of Minnesota (DRUM), https://doi.org/10.13020/xak0-gx77 ------------------- GENERAL INFORMATION ------------------- 1. Title of Dataset: Data for Multi-objective OLED Optimization Manuscript 2. Author Information Principal Investigator Contact Information Name: Vivian E. Ferry Institution: University of Minnesota Email: veferry@umn.edu ORCID: 0000-0002-9676-6056 Associate or Co-investigator Contact Information Name: Maya Ramamurthy Institution: University of Minnesota Email: mayaram@umn.edu ORCID: 0000-0003-2882-9024 Associate or Co-investigator Contact Information Name: Evgeny Pakhomenko Institution: University of Minnesota Email: pakho004@umn.edu ORCID: 0000-0003-1541-9966 Associate or Co-investigator Contact Information Name: John Keil Institution: University of Minnesota Email: keil0038@umn.edu Associate or Co-investigator Contact Information Name: Siliang He Institution: University of Minnesota Email: he000329@umn.edu ORCID: 0000-0002-5050-2530 Associate or Co-investigator Contact Information Name: Abhinav Kapur Institution: University of Minnesota Email: kapur056@umn.edu Associate or Co-investigator Contact Information Name: Kyle W. Hershey Institution: Microsoft Corporation Email: Kyle.Hershey@microsoft.com Associate or Co-investigator Contact Information Name: Ying Zheng Institution: Microsoft Corporation Email: Ying.Zheng@microsoft.com Associate or Co-investigator Contact Information Name: Russell J. Holmes Institution: University of Minnesota Email: rholmes@umn.edu ORCID: 0000-0001-7183-3673 3. Date of data collection: 2025-01-25 to 2025-06-30 4. Geographic location of data collection (where was data collected?): University of Minnesota 5. Information about funding sources that supported the collection of the data: Microsoft Corporation -------------------------- SHARING/ACCESS INFORMATION -------------------------- 1. Licenses/restrictions placed on the data: CC0 1.0 Universal https://www.google.com/url?q=http://creativecommons.org/publicdomain/zero/1.0/ 2. Links to publications that cite or use the data: Forthcoming 3. Links to other publicly accessible locations of the data: None 4. Links/relationships to ancillary data sets: None 5. Was data derived from another source? No --------------------- DATA & FILE OVERVIEW --------------------- 1. File List A. Filename: Figure2a.csv Short description: Contains the spectral radiance data data for simulated devices with ETL thicknesses between 20 and 100 nm B. Filename: Figure2b.csv Short description: Contains the simulated color shift and outcoupling efficiency for the ETL thickness sweep C. Filename: Figure2c.csv Short description: Contains the simulated and measured color coordinates for the 28 nm, 46 nm, and 91 nm devices D. Filename: Figure2d-experiment.csv Short description: Contains the measured external quantum efficiency for three devices E. Filename: Figure2d-simulated.csv Short description: Contains the simulated outcoupling efficiency for the range of ETL thicknesses F. Filename: Figure3a-simulated.csv Short description: Contains the simulated color coordinates for the 28 nm ETL device G. Filename: Figure3a-experiment.csv Short description: Contains the measured color coordinates for the 28 nm ETL device H. Filename: Figure3b-simulated.csv Short description: Contains the simulated color coordinates for the 46 nm ETL device I. Filename: Figure3b-experiment.csv Short description: Contains the measured color coordinates for the 46 nm ETL device J. Filename: Figure3c-simulated.csv Short description: Contains the simulated color coordinates for the 91 nm ETL device K. Filename: Figure3c-experiment.csv Short description: Contains the measured color coordinates for the 91 nm ETL device L. Filename: Figure5a.csv Short description: Contains the data for the ETL thickness optimization, in three coordinates M. Filename: Figure5b.csv Short description: Contains the data for the ETL thickness optimization, in two coordinates (color shift and outcoupling efficiency) N. Filename: Figure5b-inset.csv Short description: Contains the color shift data for the smallest and largest ETL thicknesses O. Filename: Figure7a.csv Short description: Contains the data pertaining to the Stability Filter Method P. Filename: Figure7b.csv Short description: Contains the data pertaining to the Stability FOM Method Q. Filename: Figure7c.csv Short description: Contains the data pertaining to the Random Averaging Method R. Filename: Figure8.csv Short description: Contains the data pertaining to the optimization of both ETL thickness and refractive index S. Filename: Figure9.csv Short description: Contains the data pertaining to the optimization of both the ETL and HIL thickness 2. Relationship between files: Each file contains the data required to make the corresponding figure. -------------------------- METHODOLOGICAL INFORMATION -------------------------- 1. Description of methods used for collection/generation of data: Optical transfer matrix models using Lumerical STACK were used to generate the simulated data. Pareto optimization in MATLAB 2019a was used to do multi-objective optimization. Devices were fabricated and measured in the Holmes lab. 2. Methods for processing the data: Data were processed using MATLAB 2019a 3. Instrument- or software-specific information needed to interpret the data: None 4. Standards and calibration information, if appropriate: n/a 5. Environmental/experimental conditions: n/a 6. Describe any quality-assurance procedures performed on the data: n/a 7. People involved with sample collection, processing, analysis and/or submission: See author list --------------------------------------- DATA-SPECIFIC INFORMATION FOR: [Figure2a] ----------------------------------------- 1. Number of variables: 6 2. Number of cases/rows: 500 3. Variable List A. Name: Wavelength Description: Wavelength in nanometers B. Name: Spectral Radiance 20 nm Description: Simulated spectral radiance for the 20 nm device in W/m2/nm/sr C. Name: Spectral Radiance 40 nm Description: Simulated spectral radiance for the 40 nm device in W/m2/nm/sr D. Name: Spectral Radiance 60 nm Description: Simulated spectral radiance for the 60 nm device in W/m2/nm/sr E. Name: Spectral Radiance 80 nm Description: Simulated spectral radiance for the 80 nm device in W/m2/nm/sr F. Name: Spectral Radiance 100 nm Description: Simulated spectral radiance for the 100 nm device in W/m2/nm/sr --------------------------------------- DATA-SPECIFIC INFORMATION FOR: [Figure2b] ----------------------------------------- 1. Number of variables: 3 2. Number of cases/rows: 19 3. Variable List A. Name: ETL Thickness Description: Electron transport layer thickness in nanometers B. Name: Color Shift Description: Simulated maximum color shift between 0 degrees and 60 deg C. Name: Outcoupling Efficiency Description: Simulated outcoupling efficiency --------------------------------------- DATA-SPECIFIC INFORMATION FOR: [Figure2c] ----------------------------------------- 1. Number of variables: 2 2. Number of cases/rows: 6 3. Variable List A. Name: CIE x Description: Color coordinate in the x dimension, using the 1931 color convention B. Name: CIE y Description: Color coordinate in the y dimension, using the 1931 color convention --------------------------------------- DATA-SPECIFIC INFORMATION FOR: [Figure2d-simulated] ----------------------------------------- 1. Number of variables: 2 2. Number of cases/rows: 23 3. Variable List A. Name: Simulated ETL Thickness Description: Simulated electron transport layer thickness in nanometers B. Name: Outcoupling Efficiency Description: Simulated outcoupling efficiency --------------------------------------- DATA-SPECIFIC INFORMATION FOR: [Figure2d-experiment] ----------------------------------------- 1. Number of variables: 2 2. Number of cases/rows: 3 3. Variable List A. Name: Measured ETL Thickness Description: Measured electron transport layer thickness in nanometers B. Name: EQE Description: Measured external quantum efficiency --------------------------------------- DATA-SPECIFIC INFORMATION FOR: [Figure3a-experiment] ----------------------------------------- 1. Number of variables: 3 2. Number of cases/rows: 7 3. Variable List A. Name: Theta Measured Description: Measured angle, in degrees B. Name: CIE x Measured Description: Measured color coordinate in the x dimension, using the 1931 color convention C. Name: CIE y Measured Description: Measured color coordinate in the y dimension, using the 1931 color convention --------------------------------------- DATA-SPECIFIC INFORMATION FOR: [Figure3b-experiment] ----------------------------------------- 1. Number of variables: 3 2. Number of cases/rows: 7 3. Variable List A. Name: Theta Measured Description: Measured angle, in degrees B. Name: CIE x Measured Description: Measured color coordinate in the x dimension, using the 1931 color convention C. Name: CIE y Measured Description: Measured color coordinate in the y dimension, using the 1931 color convention --------------------------------------- DATA-SPECIFIC INFORMATION FOR: [Figure3c-experiment] ----------------------------------------- 1. Number of variables: 3 2. Number of cases/rows: 7 3. Variable List A. Name: Theta Measured Description: Measured angle, in degrees B. Name: CIE x Measured Description: Measured color coordinate in the x dimension, using the 1931 color convention C. Name: CIE y Measured Description: Measured color coordinate in the y dimension, using the 1931 color convention --------------------------------------- DATA-SPECIFIC INFORMATION FOR: [Figure3a-simulated] ----------------------------------------- 1. Number of variables: 3 2. Number of cases/rows: 500 3. Variable List A. Name: Theta Simulated Description: Simulated angle, in degrees B. Name: CIE x Simulated Description: Simulated color coordinate in the x dimension, using the 1931 color convention C. Name: CIE y Simulated Description: Simulated color coordinate in the y dimension, using the 1931 color convention --------------------------------------- DATA-SPECIFIC INFORMATION FOR: [Figure3b-simulated] ----------------------------------------- 1. Number of variables: 3 2. Number of cases/rows: 500 3. Variable List A. Name: Theta Simulated Description: Simulated angle, in degrees B. Name: CIE x Simulated Description: Simulated color coordinate in the x dimension, using the 1931 color convention C. Name: CIE y Simulated Description: Simulated color coordinate in the y dimension, using the 1931 color convention --------------------------------------- DATA-SPECIFIC INFORMATION FOR: [Figure3c-simulated] ----------------------------------------- 1. Number of variables: 3 2. Number of cases/rows: 500 3. Variable List A. Name: Theta Simulated Description: Simulated angle, in degrees B. Name: CIE x Simulated Description: Simulated color coordinate in the x dimension, using the 1931 color convention C. Name: CIE y Simulated Description: Simulated color coordinate in the y dimension, using the 1931 color convention --------------------------------------- DATA-SPECIFIC INFORMATION FOR: [Figure5a] ----------------------------------------- 1. Number of variables: 4 2. Number of cases/rows: 60 3. Variable List A. Name: Color Shift Description: Optimal points for color shift B. Name: Outcoupling Efficiency Description: Optimal points for outcoupling efficiency C. Name: Primary FOM Description: Optimal points for Primary FOM D. Name: ETL Thickness Description: Optimal ETL thickness in nanometers --------------------------------------- DATA-SPECIFIC INFORMATION FOR: [Figure5b-inset] ----------------------------------------- 1. Number of variables: 5 2. Number of cases/rows: 500 3. Variable List A. Name: Theta Description: Simulated angle, in degrees B. Name: CIE x 55 nm Description: Simulated color coordinate in the x dimension, using the 1931 color convention, for the 55 nm ETL device C. Name: CIE y 55 nm Description: Simulated color coordinate in the y dimension, using the 1931 color convention, for the 55 nm ETL device D. Name: CIE x 68 nm Description: Simulated color coordinate in the x dimension, using the 1931 color convention, for the 68 nm ETL device E. Name: CIE y 68 nm Description: Simulated color coordinate in the y dimension, using the 1931 color convention, for the 68 nm ETL device --------------------------------------- DATA-SPECIFIC INFORMATION FOR: [Figure7a] ----------------------------------------- 1. Number of variables: 4 2. Number of cases/rows: 7 3. Variable List A. Name: Color Shift Description: Optimal points for color shift B. Name: Outcoupling Efficiency Description: Optimal points for outcoupling efficiency C. Name: Primary FOM Description: Optimal points for Primary FOM D. Name: ETL Thickness Description: Optimal ETL thickness in nanometers --------------------------------------- DATA-SPECIFIC INFORMATION FOR: [Figure7b] ----------------------------------------- 1. Number of variables: 4 2. Number of cases/rows: 60 3. Variable List A. Name: Color Shift Description: Optimal points for color shift B. Name: Outcoupling Efficiency Description: Optimal points for outcoupling efficiency C. Name: Primary FOM Description: Optimal points for Primary FOM D. Name: ETL Thickness Description: Optimal ETL thickness in nanometers --------------------------------------- DATA-SPECIFIC INFORMATION FOR: [Figure7c] ----------------------------------------- 1. Number of variables: 4 2. Number of cases/rows: 60 3. Variable List A. Name: Color Shift Description: Optimal points for color shift B. Name: Outcoupling Efficiency Description: Optimal points for outcoupling efficiency C. Name: Primary FOM Description: Optimal points for Primary FOM D. Name: ETL Thickness Description: Optimal ETL thickness in nanometers --------------------------------------- DATA-SPECIFIC INFORMATION FOR: [Figure8] ----------------------------------------- 1. Number of variables: 5 2. Number of cases/rows: 60 3. Variable List A. Name: Color Shift Description: Optimal points for color shift B. Name: Outcoupling Efficiency Description: Optimal points for outcoupling efficiency C. Name: Primary FOM Description: Optimal points for Primary FOM D. Name: ETL Thickness Description: Optimal ETL thickness in nanometers E. Name: ETL Index Description: Optimal ETL refractive index --------------------------------------- DATA-SPECIFIC INFORMATION FOR: [Figure9] ----------------------------------------- 1. Number of variables: 5 2. Number of cases/rows: 60 3. Variable List A. Name: Color Shift Description: Optimal points for color shift B. Name: Outcoupling Efficiency Description: Optimal points for outcoupling efficiency C. Name: Primary FOM Description: Optimal points for Primary FOM D. Name: ETL Thickness Description: Optimal ETL thickness in nanometers E. Name: HIL Thickness Description: Optimal hole transport layer thickness in nanometers -------------------------- DATA TREE -------------------------- | README_updated_081825.txt | +---Figure 2 | | Figure2a.csv | | Figure2b.csv | | Figure2c.csv | | Figure2d-experiment.csv | | Figure2d-simulated.csv | | | \---__MACOSX | ._Figure2a.csv | ._Figure2b.csv | ._Figure2c.csv | ._Figure2d-experiment.csv | ._Figure2d-simulated.csv | +---Figure 3 | | Figure3a-experiment.csv | | Figure3a-simulated.csv | | Figure3b-experiment.csv | | Figure3b-simulated.csv | | Figure3c-experiment.csv | | Figure3c-simulated.csv | | | \---__MACOSX | ._Figure3a-experiment.csv | ._Figure3a-simulated.csv | ._Figure3b-experiment.csv | ._Figure3b-simulated.csv | ._Figure3c-experiment.csv | ._Figure3c-simulated.csv | +---Figure 5 | | Figure5a.csv | | Figure5b-inset.csv | | Figure5b.csv | | | \---__MACOSX | ._Figure5a.csv | ._Figure5b-inset.csv | ._Figure5b.csv | +---Figure 7 | | Figure7a.csv | | Figure7b.csv | | Figure7c.csv | | | \---__MACOSX | ._Figure7a.csv | ._Figure7b.csv | ._Figure7c.csv | +---Figure8.csv | \---Figure9.csv