Data for Electron Microscopy Transfer System to Protect Atmosphere-sensitive Materials for Scanning Electron Microscopy Characterization

Abstract

This data was collected to provide evidence for the successful ability of a novel scanning electron microscopy sample preparation method to protect highly atmosphere- and/or moisture-sensitive materials from undesired exposure to atmosphere. Initial proof-of-concept experiments were conducted with highly hygroscopic MgCl2 material exposed to controlled humidity environments and qualitative (photographs) and quantitative data (x-ray diffraction) were collected to compare samples that were prepared (1) with the use of the sample protection/preparation method (2) with no protections provided. Following this, hygroscopic BaO thin films were synthesized and prepared with the outlined method and characterized via scanning electron microscopy to demonstrate the functional application of the preparation technique.