This readme.txt file was generated on <2020-08-05> by ------------------- GENERAL INFORMATION ------------------- 1. Title of Dataset Data for "Scattering mechanisms and mobility enhancement in epitaxial BaSnO3thin films probed via electrolyte gating" 2. Author Information Principal Investigator Contact Information Name: Wang, Helin Institution: University of Minnesota Address: Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455, USA Email: wang5424@umn.edu ORCID: Associate or Co-investigator Contact Information Name: Prakash, Abhinav Institution: University of Minnesota Address: Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455, USA Email: praka019@umn.edu ORCID: Associate or Co-investigator Contact Information Name:Reich, Konstantin Institution: Ioffe Institute Address: Ioffe Institute, St. Petersburg 194021, Russia Email: Reich@mail.ioffe.ru ORCID: Associate or Co-investigator Contact Information Name: Ganguly, Koustav Institution: University of Minnesota Address: Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455, USA Email: gangu015@umn.edu ORCID: Associate or Co-investigator Contact Information Name: Leighton, Chris Institution: University of Minnesota Address: Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota 55455, USA Email: leighton@umn.edu ORCID: 3. Date of data collection (single date, range, approximate date) 20150101 - 20191231 4. Geographic location of data collection (where was data collected?): University of Minnesota 5. Information about funding sources that supported the collection of the data: This work was primarily supported by the National Science Foundation (NSF) through the University of Minnesota (UMN) MRSEC under Grant No. DMR-1420013. Parts of this work were carried out at the Characterization Facility, UMN, which receives partial support from the NSF through the MRSEC program. Portions of this work were also conducted at the Minnesota Nano Center, which is supported by the NSF through the National Nano Coordinated Infrastructure Network, under Grant No. NNCI-1542202. -------------------------- SHARING/ACCESS INFORMATION -------------------------- 1. Licenses/restrictions placed on the data: Creative Commons Attribution-NonCommercial-NoDerivs 3.0 United States, http://creativecommons.org/licenses/by-nc-nd/3.0/us/ 2. Links to publications that cite or use the data: Wang, H., Prakash, A., Reich, K., Ganguly, K., Jalan, B., & Leighton, C. (2020). Scattering mechanisms and mobility enhancement in epitaxial BaSnO3 thin films probed via electrolyte gating. APL Materials, 8(7), 071113. https://doi.org/10.1063/5.0017227 3. Links to other publicly accessible locations of the data: 4. Links/relationships to ancillary data sets: 5. Was data derived from another source? If yes, list source(s):No 6. Recommended citation for the data: Wang, Helin; Prakash, Abhinav; Reich, Konstantin; Ganguly, Koustav; Leighton, Chris. (2020). Data for "Scattering mechanisms and mobility enhancement in epitaxial BaSnO3thin films probed via electrolyte gating". Retrieved from the Data Repository for the University of Minnesota, https://doi.org/10.13020/k4c3-m128. --------------------- DATA & FILE OVERVIEW --------------------- 1. File List A. Filename: T-dependent transport.zip Short description: Temperature- and gate voltage-dependent sheet resistance (Rs), electron density (n), and mobility (u) for various electrolyte-gated-BaSnO3 films (29nm-, 30nm-,51nm-,and 54nm-thick BaSnO3 films) (12 text files) B. Filename: Mobilty vs electron density analysis.zip Short description: Mobility vs electron density data for T=2-50K and 300K (2 text files) C. Filename: Ndisl vs d.txt Short description: Extracted dislocation density data D. Filename: STEM image analysis.txt Short description: Surface roughness analysis data C. Filename: Mobility Fitting Result.zip Short description: Mobility vs electron density fitting results (7 txt files) 2. Relationship between files: 3. Additional related data collected that was not included in the current data package: 4. Are there multiple versions of the dataset? no -------------------------- METHODOLOGICAL INFORMATION -------------------------- 1. Description of methods used for collection/generation of data: Electronic transport measurements and structural characterization https://doi.org/10.1063/5.0017227 ----------------------------------------- DATA-SPECIFIC INFORMATION FOR: T-dependent transport.zip ----------------------------------------- 1. Number of variables: 2. Number of cases/rows: 3. Missing data codes: 4. Variable List A. Name: T(K) Description: Temperature B. Name: Rs_xV(Ohm/sq) Description: Sheet resistance at gate voltage = x V, x = 0, 1, 1.5, 2, 3, 4 C. Name: dA_xK(nm) Description: Accumulation layer thickness at x K, x= 300, 150, 50, 10, 2 D. Name: nA_xK(cm-3) Description: Accumulation layer electron density at x K, x= 300, 150, 50, 10, 2 E. Name: uA_xK(cm2V-1s-1) Description: Accumulation layer mobility at x K, x= 300, 150, 50, 10, 2 F. Name: nH_xK(cm-3) Description: Hall electron density at x K, x= 300, 150, 50, 10, 2 G. Name: uH_xK(cm2V-1s-1) Description: Hall mobility at x K, x= 300, 150, 50, 10, 2 ----------------------------------------- DATA-SPECIFIC INFORMATION FOR: Mobility vs electron density analysis.zip ----------------------------------------- 1. Number of variables: 2. Number of cases/rows: 3. Missing data codes: 4. Variable List A. Name: nA_xnm(cm-3) Description: Accumulation layer electron density for x nm-thick BaSnO3 films grown by sputter deposition, x= 12, 51, 54 B. Name: uA_xnm(cm2V-1s-1) Description: Accumulation layer mobility for x nm-thick BaSnO3 films grown by sputter deposition, x= 12, 51, 54 C. Name: nA_xnm_MBE(cm-3) Description: Accumulation layer electron density for x nm-thick BaSnO3 films grown by MBE, x= 30, 29, 51 D. Name: uA_xnm_MBE(cm2V-1s-1) Description: Accumulation layer mobility for x nm-thick BaSnO3 films grown by MBE, x= 30, 29, 51 ----------------------------------------- DATA-SPECIFIC INFORMATION FOR: Mobility Fitting Result.zip ----------------------------------------- 1. Number of variables: 2. Number of cases/rows: 3. Missing data codes: 4. Variable List A. Name: n(cm-3) Description: Accumulation layer electron density B. Name: u_disl(cm2V-1s-1) Description: Accumulation layer mobility associated with dislocation scattering C. Name: u_ii(cm2V-1s-1) Description: Accumulation layer mobility associated with ionized impurity scattering D. Name: u_surface(cm2V-1s-1) Description: Accumulation layer mobility associated with surface roughness scattering E. Name: u_ion gel(cm2V-1s-1) Description: Accumulation layer mobility associated with ion gel scattering F. Name: u_total_low T(cm2V-1s-1) Description: Accumulation layer mobility at low temperature G. Name: u_total_300K(cm2V-1s-1) Description: Accumulation layer mobility at 300 K ----------------------------------------- DATA-SPECIFIC INFORMATION FOR: Ndisl vs d.txt ----------------------------------------- 1. Number of variables: 2. Number of cases/rows: 3. Missing data codes: "--" means data is not applicable here 4. Variable List A. Name: d_sputter(nm) Description: Thickness of sputtered BaSnO3 films B. Name: Ndisl_sputter(cm-2) Description: Extracted dislocation density for sputtered BaSnO3 films C. Name: d_MBE(nm) Description: Thickness of MBE BaSnO3 films D. Name: Ndisl_MBE(cm-2) Description: Extracted dislocation density for MBE BaSnO3 films ----------------------------------------- DATA-SPECIFIC INFORMATION FOR: STEM image analysis.txt ----------------------------------------- 1. Number of variables: 2. Number of cases/rows: 3. Missing data codes: 4. Variable List A. Name: Distance(nm) Description: Distance B. Name: h(Angstrom) Description: Height C. Name: Autocovariance(Angstrom^2) Description: Autocovariance ("--" means data not applicable) D. Name: Autocovariance_fit(Angstrom^2) Description: ThE fit to the Autocovariance