This codebook.txt file was generated on 2019-03-14 by Nicholas Lewellyn ------------------- GENERAL INFORMATION ------------------- 1. Resistance versus temperature of an Indium Oxide thin film sample "b15c12" at various applied perpendicular magnetic field values 2. Author Information Principal Investigator Contact Information Name: Allen Goldman Institution: University of Minnesota Address: Minneapolis, Minnesota 55455, USA Email: goldman@umn.edu Associate or Co-investigator Contact Information Name: Nicholas Lewellyn Institution: University of Minnesota Address: Minneapolis, Minnesota 55455, USA Email: lewel019@umn.edu 3. Date of data collection (single date, range, approximate date) The RvT and RvT_lowT data were measured during a single cool down of the dilution refrigerator from 2018-03-14 through 2018-05-26. The ppms data was measured in a single cool down of a Quantum Design PPMS from 2018-06-19 through 2018-06-21. 4. Geographic location of data collection (where was data collected?): Data were measured in the Oxford Kelvinox 25 dilution refrigerator, located in room 20, and in a Quantum Design PPMS in room 285, both part of the Goldman lab space in the Physics and Nanotechnology building on University of Minnesota Twin Cities Campus. 5. Information about funding sources that supported the collection of the data: This work was supported by the National Science Foundation under Grant Nos. DMR-1209578 and DMR-1704456. Portions of this work were conducted in the Minnesota Nano Center, which is supported by the National Science Foundation through the National Nano Coordinated Infrastructure Network (NNCI) under Award Number ECCS-1542202. -------------------------- SHARING/ACCESS INFORMATION -------------------------- 1. Licenses/restrictions placed on the data: CC0 1.0 Universal Public Domain Dedication, http://creativecommons.org/publicdomain/zero/1.0/ 2. Links to publications that cite or use the data: Nicholas A. Lewellyn, Ilana M. Percher, JJ Nelson, Javier Garcia-Barriocanal, Irina Volotsenko, Aviad Frydman, Thomas Vojta, and Allen M. Goldman Phys. Rev. B 99, 054515 (2019), https://journals.aps.org/prb/abstract/10.1103/PhysRevB.99.054515 3. Links to other publicly accessible locations of the data: 4. Links/relationships to ancillary data sets: 5. Was data derived from another source? no 6. Recommended citation for the data: Lewellyn, Nicholas, A; Goldman, Allen, M. (2019). Resistance versus temperature of an Indium Oxide thin film sample "b15c12" at various applied perpendicular magnetic field values. Retrieved from the Data Repository for the University of Minnesota, https://doi.org/10.13020/sf5h-xh91. --------------------- DATA & FILE OVERVIEW --------------------- 1. File List A. Filenames: Data set comprised of 22 files, labeled RvT__H=T.txt gives the value of the magnetic field applied perpendicular to the sample during measurement. indicates the time of day the data file was created, using either a 12- or 24-hour clock. This was used to differentiate the files resulting from different measurements made at the same field strength. Short description: DC sheet resistance of a thin amorphous indium oxide film, measured as a function of temperature at a range of magnetic fields to show a transition from a superconducting state to a metallic state. Measured in an Oxford Kelvinox 25 dilutions refrigerator. B. Filename: Data set comprised of 16 files, labeled RvT__H=T_lowT.txt gives the value of the magnetic field applied perpendicular to the sample during measurement. indicates the time of day the data file was created, using either a 12- or 24-hour clock. indicates the first or second file at that magnetic field value Short description: DC sheet resistance of a thin amorphous indium oxide film, measured as a function of temperature at a range of magnetic fields to show a transition from a superconducting state to a metallic state. These values were measured much slower than in the other data set and multiple measurements were made at each temperature. Measured in an Oxford Kelvinox 25 dilutions refrigerator. C. Filename: Data set comprised of 10 files, labeled RvT_ppms_T.txt gives the value of the magnetic field applied perpendicular to the sample during measurement. Short description: DC sheet resistance of a thin amorphous indium oxide film, measured as a function of temperature at a range of magnetic fields to show a transition from a superconducting state to a metallic state. Measured in a Quantum Design PPMS. 2. Relationship between files: The data in these files all come from the same sample. File sets A and B were both measured during the same cool down of the dilution refrigerator. Set B was measured more slowly and with lower measurement currents. The files in set C were measured during a separate cool down in a different system. These measurements extend to lower applied magnetic fields and higher temperatures. Within each set the difference between the files in the applied perpendicular magnetic field. 3. Additional related data collected that was not included in the current data package: 4. Are there multiple versions of the dataset? no -------------------------- File Specific INFORMATION -------------------------- RvT and RvT_lowT files -------------------------- Time (s) = timestamp in seconds Temperature (K) = mixing chamber temperature in degrees Kelvin Field (T) = magnetic field in tesla Current (A) = excitation current in Ampere units Vg (V) = applied gate voltage (zero in all the measurements) R_sample_therm (Ohms) = sample holder thermometer in Ohms Temperature (K) = sample holder thermometer in degrees Kelvin R_horiz (Ohms) = Horizontal resistance data in Ohms R_vert (Ohms)= Vertical resistance data in Ohms Sheet Resistance (Ohms/square) = sheet resistances calculated numerically from the directional components R[1234] (Ohms) = resistance data for contact configuration 1234 R_Stdv[1234] (Ohms) = standard deviation of resistance for contact configuration 1234 R_StErr[1234] (Ohms) = standard error of resistance for contact configuration 1234 V_avg[1234] (V) = average measured voltage for contact configuration 1234 V_Stdv[1234] (V) = standard deviatoin of the voltage measurements for contact configuration 1234 . . (continues for contact configurations 2143, 3142, 1324, 4321, 3412, 2413, 4231) . Pulse width (ms) = total duration of DC current pulse in milliseconds # of readings = number of current and voltage measurements averaged into final resistance value In each data file, the first seven columns provide the timestamp, mixing chamber temperature, magnetic field, excitation current, gate voltage (always zero), sample holder thermometer resistance, and sample holder temperature for each measurement. The eighth through tenth column give measured resistance values using DC current. Columns 11-50 provide the resistance, standard deviation, standard error, average voltage, and standard deviation of the voltage for eight different contact configurations. Columns 51 and 52 provide the length of time the DC current was on and the number of measurements averaged over. The contact configuration denotes the position of the current and voltage contacts on the sample in the following way and the numbers correspond to corners of the square sample, 1243 going clockwise around the sample. RvT_ppms files ---------------------- Temperature (K) = sample temperature in degrees Kelvin Field (mT) = magnetic field in militesla Sheet Resistance (Ohms/square) = sheet resistances calculated numerically from the directional components Temperature (K) = interpolated temperature in degrees Kelvin Interpolated Y1 = interpolated resistance values in Ohms/square -------------------------- METHODOLOGICAL INFORMATION -------------------------- 1. Description of methods used for collection/generation of data: These R vs. T curves are "warming curves", in that points were measured in order of ascending temperature. Between each measured data point heat was applied to the sample to raise its temperature, and resistance measurements began only after temperature measurements determined the sample temperature was stable. Resistance thermometry was used to determine the temperature. Resistance values were measured by sourcing a current and measuring the resultant voltage drop across the sample. This was done using a Keithley 6221 precision current source and a Keithley 2182 nanovoltmeter. The amorphous indium oxide thin film sample was made in a square pattern, with contacts on the corners. This enabled the measurement of sheet resistance by rotating around this square and averaging in the manner developed by van der Pauw. In this process, resistance is calculated in the orthogonal directions parallel to the film, which we label as "horizontal and "vertical". From these resistances, a sheet resistance was calculated. 2. Methods for processing the data: Sheet resistance was calculated numerically (using a Matlab script) from the horizontal and vertical components of resistance using the van der Pauw method. 3. Instrument- or software-specific information needed to interpret the data: 4. Standards and calibration information, if appropriate: Temperature measurements were made using a Ruthenium Oxide thermometer last calibrated by LakeShore ~2 years ago. 5. Environmental/experimental conditions: 6. Describe any quality-assurance procedures performed on the data: I-V data were collected at base temperature before each R vs. T curve to verify that the resistances measured fell within the linear Ohmic regime. NOTE: The magnetic field strengths were determined via calibration between the superconducting magnet power supply's sourced current and the specifications of the magnet itself. This is thought to be a reliable measure as results were consistent with each other as well prior measurements using a different magnet. 7. People involved with sample collection, processing, analysis and/or submission: Nicholas A. Lewellyn JJ Nelson