This readme.txt file was generated on 07-20-21 by the Data Repository for the University of Minnesota (DRUM) Recommended citation for the data: Lewellyn, Nicholas A; Goldman, Allen M. (2021). Indium Oxide Resistance Fluctuation Measurements. Retrieved from the Data Repository for the University of Minnesota, https://doi.org/10.13020/V2VB-9E61. ------------------- GENERAL INFORMATION ------------------- 1. Title of Dataset: Indium Oxide Resistance Fluctuation Measurements 2. Author Information Principal Investigator Contact Information Name: Allen M Goldman Institution: Goldman group, Physics Department Address: University of Minnesota Email: goldman@umn.edu ORCID: Associate or Co-investigator Contact Information Name: Nicholas A Lewellyn Institution: Address: Email: ORCID: 3. Date published: 2021-07-19 4. Date of data collection: 2020-07-15 to 2021-04-09 5. Geographic location of data collection: 6. Information about funding sources that supported the collection of the data: This work was supported by the National Science Foundation under Grant Nos. DMR-1209578 and DMR-1704456. Portions of this work were conducted in the Minnesota Nano Center, which is supported by the National Science Foundation through the National Nano Coordinated Infrastructure Network (NNCI) under Award Number ECCS-1542202. 7. Overview of the data (abstract): For superconducting indium oxide films with higher disorder, a more conventional superconductor-insulator transition is observed. Low frequency resistance measurements performed on such a film are shown in this dataset. Contrary to initial expectations there were no significant changes in the noise properties near the quantum critical point. However, it was found that the noise varied in a way that was consistent with predictions based on a percolation model. Specifically, the noise properties suggest that the superconductor-insulator transition can be modeled by p-model percolation. This model is based on random Josephson junction array models which have been used extensively to explain the properties of granular superconductors. -------------------------- SHARING/ACCESS INFORMATION -------------------------- 1. Licenses/restrictions placed on the data: CC0 1.0 Universal, http://creativecommons.org/publicdomain/zero/1.0/ 2. Links to publications that cite or use the data: 3. Was data derived from another source? If yes, list source(s): 4. DRUM Terms of Use: By using these files, users agree to the Terms of Use. https://conservancy.umn.edu/pages/drum/policies/#terms-of-use --------------------- DATA & FILE OVERVIEW --------------------- Voltage versus time traces for indium oxide film that undergoes an SIT. The noise measurement was in a Wheatstone bridge configuration and measured resistance fluctuations. Resistance versus temperature sweeps are also included. All data was measured in an Oxford Kelvinox K400 dilution refrigerator. 1. File List A. Filename: Resistance_v_Temperature_data.zip Short description: Resistance versus temperature data for InOx061520_2 (61 txt files) Size: 205.4Kb B. Filename: Noise data.zip Short description: Raw voltage versus time traces output from lock-in amplifier arranged according to Scofield resistance fluctuation measurement technique. Also includes corresponding spectra. Size: 20.20Gb -------------------------- METHODOLOGICAL INFORMATION -------------------------- 1. Description of methods used for collection/generation of data: 2. Methods for processing the data: 3. Instrument- or software-specific information needed to interpret the data: 4. Standards and calibration information, if appropriate: 5. Environmental/experimental conditions: 6. Describe any quality-assurance procedures performed on the data: 7. People involved with sample collection, processing, analysis and/or submission: ----------------------------------------- DATA-SPECIFIC INFORMATION FOR: Resistance_v_Temperature_data.zip ----------------------------------------- Temperature is in Kelvin unless labeled mK, then it is in milliKelvin. Time is in seconds, voltage in volts, current in amps, etc. One possible point of confusion is A which when referring to current is amps, but when referring to thickness is angstroms. There are 36 files in the folder named with this structure: I-V_220 AM_H=3T_InOx_061520_2.txt These files are voltage versus current sweeps at fixed temperature. Using the above file name as an example, the measurement started at 2:20am, the applied perpendicular magnetic field was 3 tesla, and the sample measured was InOx_061520_2. 1. Number of variables: 6 2. Number of cases/rows: 3. Missing data codes: 4. Variable List Time (s) Temperature (K) Current (A) Voltage (V) St.Dev (V) Variance (V) There are 25 files n the folder named with this structure: RvT_1210 AM_H=1T_InOx_061520_2_low_current.txt The files are resistance versus temeperature sweeps. Using the above file name as an example, the measurement started at 12:10am, the applied perpendicular magnetic field was 1 tesla, and the sample measured was InOx_061520_2. 1. Number of variables: 2. Number of cases/rows: 3. Missing data codes: 4. Variable List R1 (Ohms) T (K) Time (s) I (A) B (T) Thickness (A) Vgate (V) V+ (V) V+ sigma (V) V- (V) V- sigma (V) Vsignal (V) Vsignal sigma (V) S/N MXCH P (W) R2 (Ohms) #182 Avgs #AVS Avgs Avs StDev (K) AVS sigma Req (K) % Acc Tsetpt 220 wait t (s) Max T wait t (s) Sigma R (Ohms) Thermal Equil Wait Time (s) #182 Avgs <100mK T1 (K) T2 (K) Current Hi (A) Current Low (A) 7/29/2020 12:40 AM ----------------------------------------- DATA-SPECIFIC INFORMATION FOR: Noise data.zip ----------------------------------------- Files in the folder are named with this structure: Spectra_Avg_258 PM_H=1000mT_InOx_061520_20nA_125mK_6210_ These files are one of three types, either a raw voltage versus time trace, a set of averaged spectra, or multiply sets of spectra. This is indicated by the first part of the file name. Using the above name as an example the start time of the measurement was 2:58pm, the applied perpendicular magnetic field was 10000 milliTesla, the sample name was InOx_061520_2, the applied current was 20nA, and the temperature was 125mK. 1. Number of variables: 5 2. Number of cases/rows: 3. Missing data codes: 4. Variable List Frequency (Hz) Power 0 (V^2/Hz) Fourier transform of in-phase component of voltage versus time trace Power 90(V^2/Hz) Fourier transform of out-of-phase component of voltage versus time trace Power Sub not used Temp not used Files in the folder are named with this structure: Sampled_V_258 PM_H=1000mT_InOx_061520_20nA_125mK_6210_ 1. Number of variables: 3 2. Number of cases/rows: 3. Missing data codes: 4. Variable List Time (s) Voltage 0 (V) in-phase output from lock-in amplifier Voltage 90 (V) out-of-phase output from lock-in amplifier Files in the folder are named with this structure: Spectra_258 PM_H=1000mT_InOx_061520_20nA_125mK_6210_ 1. Number of variables: 3 2. Number of cases/rows: 3. Missing data codes: 4. Variable List Frequency (Hz) Power 0 (V^2/Hz) in-phase spectra Power 90 (V^2/Hz) out-of-phase spectra