This study demonstrated that the design of current
intelligence test short forms could be improved
by employing a more effective method of item selection
based on psychometric theory. Two short forms
of the recently published WISC-R were developed,
one employing a design determined by empirical
item analysis results of the standard test battery
and the other employing the well-known Yudin
scheme determined by systematic random selection
of test items. In all analyses the item analysis
method of item selection was shown to yield more
accurate results than the Yudin procedure. Practical
usefulness as well as limitations of the present
WISC-R Short form are discussed.
Goh, David S. (1979). Empirical versus random item selection in the design of intelligence test short forms-The WISC-R example. Applied Psychological Measurement, 3, 75-82. doi:10.1177/014662167900300109
Goh, David S..
Empirical versus random item selection in the design of intelligence test short forms-The WISC-R example.
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