Applied Physics Letters (American Institute of Physics)
Magnetic force microscope(MFM) profiles of domain walls (DWs) in magnetite were measured using commercially available MFM tips. Opposite polarity profiles of a single DW segment were obtained by magnetizing the MFM tip in opposite directions perpendicular to the sample surface. During a measurement, the field of the tip locally magnetized the DW, resulting in a more attractive tip‐sample interaction. The difference between opposite polarity DW profiles provided a qualitative measurement of the reversible changes in DW structure due to the localized field of the MFM tip.
Foss, S., R. Proksch, E. D. Dahlberg, B. M. Moskowitz and B. Walsh (1996). "Localized micromagnetic perturbation of domain walls in magnetite using a magnetic force microscope." Applied Physics Letters 69(22): 3426-3428.
This work was supported by the Office of Naval Research, N00014-94-1-0123 (SF, RP, EDD). BM was also supported by the NSF under Grant Nos. EAR-9304520 and EAR-9526812. This is contribution 9607 of the Institute for Rock Magnetism.
Foss, Sheryl; Proksch, Roger; Dahlberg, E.D.; Moskowitz, Bruce; Walsh, B..
Localized micromagnetic perturbation of domain walls in magnetite using a magnetic force microscope.
Applied Physics Letters (American Institute of Physics).
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