Two methods are derived for estimating measures
of pass-fail reliability. The methods require only a single
test administration and are computationally simple.
Both are based on the Spearman-Brown formula for
estimating stepped-up reliability. The non-distributional
method requires only that the test be divisible
into parallel half-tests; the normal method makes the
additional assumption of normally distributed test
scores. Bias for the two procedures is investigated by
simulation. For nearly normal test score distributions,
the normal method performed slightly better than the
non-distributional method, but for moderately to severely
skewed or symmetric platykurtic test score distributions
the non-distributional method was superior.
Test results from a licensure examination are used to
illustrate the methods. Index terms: Cohen’s kappa,
licensure examinations, pass-fail reliability, reliability,
Woodruff, David J & Sawyer, Richard L. (1989). Estimating measures of pass-fail reliability from parallel half-tests. Applied Psychological Measurement, 13, 33-43. doi:10.1177/014662168901300104
Woodruff, David J.; Sawyer, Richard L..
Estimating measures of pass-fail reliability from parallel half-tests.
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