A model and estimator for examinee-level measurement
error variance are developed. Although the binomial
distribution is basic to the modeling, the proposed
error model provides some insights into
problems associated with simple binomial error, and
yields estimates of error that are quite distinct from binomial
error. By taking into consideration test form
difficulty adjustments often used in standardized tests,
the model is linked also to indices designed for identifying
unusual item response patterns. In addition, average
error variance under the model is approximately
that which would be obtained through a KR-20 estimate
of reliability, thus providing a unique justification for
this popular index. Empirical results using odd-even
and alternate-forms measures of error variance tend to
favor the proposed model over the binomial.
Jarjoura, David. (1986). An estimator of examinee-level measurement error variance that considers test form difficulty adjustments. Applied Psychological Measurement, 10, 175-186. doi:10.1177/014662168601000209
An estimator of examinee-level measurement error variance that considers test form difficulty adjustments.
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